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Langer EMV P603-1/P750 Set IC Test System RF Conducted Measurement IEC 61967-4

$ 4392.43

Availability: 10 in stock
  • Brand: Langer EMV
  • All returns accepted: ReturnsNotAccepted
  • MPN: P603-1/P750
  • Condition: New
  • Country/Region of Manufacture: Germany

    Description

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    Multimeters
    Counters & Timers
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    Other Test Equipment
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    Spectrum Analyzers
    Other Microwave Equipment
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    Pressure Calibrators
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    Langer EMV P603-1/P750 Set IC Test System RF Conducted Measurement IEC 61967-4
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    PRODUCT DESCRIPTION
    This item is a new
    Langer EMV P603-1/P750 Set IC Test System RF Conducted Measurement IEC 61967-4.
    Please allow
    2 - 3
    weeks lead time for this product to arrive.
    This set consists of:
    1xP603-1, RF Current Probe 1 Ohm
    1xP750, RF Voltage Probe 150 Ohm
    1xCS-ESA, ChipScan-ESA Software, USB
    1xSMA-SMB 1 m, SMA-SMB Measuring Cable
    1xP603 / P750 case, System Case
    1xP603-1 / P750 m, P603 / P750 Set User Manual
    **Please note this set requires some pieces of Langer ICE1 Test Set**
    https://www.ebay.com/itm/303533242321
    This item comes with a 12 Month (One Year) warranty
    from the
    manufacturer.
    We Calibrate your Test Equipment! Contact us for more information on Calibration by
    visiting
    stratatek.com/calibration
    The probe set is used to measure conducted emissions (measurements with direct 1 Ohm/150 Ohm-coupling) according to IEC 61967-4 at IC pins. For the current and voltage measurement there is one respective probe available. Every Test-IC pin can be reached and contacted by the probe.
    The measurements with the probe set guarantee a high precision when repeated and comparability of measurements. The ICE1 IC test environment of Langer EMV-Technik is used to start the test IC. measurements can be done with ChipScan-ESA software. Measurement results of all measured pins are saved in the software and can be compared fast and systematically.
    The P603-1 probe is a 1-Ω-probe for direct measurement of high frequency (RF) current at IC pins. It is used to measure at ground pins (Vss) and signal pins. The RF current probe 1 Ohm has a pin contact with which every IC pin can be separately contacted and measured.
    The P750 RF voltage probe corresponds to a 150 ohm coupling network according to IEC 61967-4 for the RF voltage measurement at IC pins. The P750 probe has of a high resistance, capacitive coupled input. RF voltages can be measured at different pins of the device under test.
    **Please note this set requires some pieces of Langer ICE1 Test Set**
    https://www.ebay.com/itm/303533242321
    Any questions or clarifications, feel free to ask
    Please see our other items!  Visit Stratatek.com
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    About Us
    Stratatek Test & Measurement is a source for new and used test equipment, measurement equipment, and industrial process & control calibrators and meters. We calibrate in-house, traceable to NIST.
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    Yes, all of our prices are in United States Dollars (USD)
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    We accept Visa, Mastercard, American Express, and Paypal online.  We also accept traditional payments like wire transfer, cash, or money order.  We accept Purchase Orders from large companies with approval.
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    All used equipment comes with a minimum 90 Day Warranty.  Your unit is guaranteed to be fully functional or money will be refunded upon return.  New products typically carry a 1 Year Warranty.
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